silicon

Lattice-Mismatch Induced Stress in Porous Silicon Films
We have studied the stress in porous silicon films with different porosities at the interface with the substrate. Micro-Raman spectra …
Citar DOI
Depth-Resolved Microspectroscopy of Porous Silicon Multilayers
We have measured micro-photoluminescence (PL) and micro-Raman spectra on the cross section of porous silicon multilayers to sample …
Citar DOI
Determination of Stress in Porous Silicon by Micro-Raman Spectroscopy
We have studied the stress in porous silicon films as a function of depth and porosity using micro-Raman spectroscopy. Raman spectra …
Citar DOI
Laser Heating in Porous Silicon Studied by Micro-Raman Spectroscopy
We have measured the temperature rise in nanoporous silicon under strong illumination. A green laser beam was focused with a microscope …
Citar DOI
A Galvanostatic Study of the Electrodeposition of Polypyrrole Into Porous Silicon
Polypyrrole has been electrodeposited in the interior of the pores that form the porous silicon structure, and a very significant …
Citar DOI
Depth-Resolved Microspectroscopy of Porous Silicon Multilayers
Appl. Phys. Lett. 75, 977–979 (1999)
Citar DOI
Depth-Resolved Microspectroscopy of Porous Silicon Multilayers
Deposition of polypyrrole into porous silicon
in Advances in Microcrystalline and Nanocrystalline Semiconductors - 1996, R. W. Collins, P. M. Fauchet, I. Shimizu, J. C. Vial, T. Shimada, and A. P. Alivisatos, ed. (Materials Research Society, Pittsburgh, 1997)
Citar DOI
Deposition of polypyrrole into porous silicon
Depth-resolved micro-Raman study of porous silicon at different oxidation states
Photoluminescence ~PL! and Raman spectra were measured along a cross section of porous silicon films at different oxidation times after …
Citar DOI
Selection rules in the Raman spectrum of porous silicon
in Advances in Microcrystalline and Nanocrystalline Semiconductors - 1996, R. W. Collins, P. M. Fauchet, I. Shimizu, J. C. Vial, T. Shimada, and A. P. Alivisatos, ed. (Materials Research Society, Pittsburgh, 1997)
Citar DOI
Selection rules in the Raman spectrum of porous silicon