stress

Lattice-Mismatch Induced Stress in Porous Silicon Films
We have studied the stress in porous silicon films with different porosities at the interface with the substrate. Micro-Raman spectra …
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Determination of Stress in Porous Silicon by Micro-Raman Spectroscopy
We have studied the stress in porous silicon films as a function of depth and porosity using micro-Raman spectroscopy. Raman spectra …
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Espectroscopía Raman
Este capítulo es una introducción a la espectroscopía Raman. Con esta técnica óptica se estudian de forma no destructiva compuestos en …
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Espectroscopía Raman
Depth-Resolved Microspectroscopy of Porous Silicon Multilayers
Appl. Phys. Lett. 75, 977–979 (1999)
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Depth-Resolved Microspectroscopy of Porous Silicon Multilayers
On the Effects of Stresses in Ferroelectric (Pb, Ca)TiO$_3$ Thin Films
Grazing angle X-ray diffraction, profilemetry, permittivity vs. temperature and Raman spectrometry measurements have been carried out …
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