F. Agulló-Rueda
F. Agulló-Rueda
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Lattice-Mismatch Induced Stress in Porous Silicon Films
We have studied the stress in porous silicon films with different porosities at the interface with the substrate. Micro-Raman spectra …
S. Manotas
,
F. Agulló-Rueda
,
J. D. Moreno
,
F. Ben-Hander
,
J. M. Martínez-Duart
Cite
DOI
Determination of Stress in Porous Silicon by Micro-Raman Spectroscopy
We have studied the stress in porous silicon films as a function of depth and porosity using micro-Raman spectroscopy. Raman spectra …
S. Manotas
,
F. Agulló-Rueda
,
J. D. Moreno
,
F. Ben-Hander
,
R. Guerrero-Lemus
,
J. M. Martínez-Duart
Cite
DOI
Cite
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