F. Agulló-Rueda
F. Agulló-Rueda
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chemical element
Depth-resolved micro-Raman study of porous silicon at different oxidation states
Photoluminescence ~PL! and Raman spectra were measured along a cross section of porous silicon films at different oxidation times after …
J. D. Moreno
,
F. Agulló-Rueda
,
E. Montoya
,
M. L. Marcos
,
J. González-Velasco
,
R. Guerrero-Lemus
,
J. M. Martínez-Duart
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