silicon

Depth-Resolved Microspectroscopy of Porous Silicon Multilayers

We have measured micro-photoluminescence (PL) and micro-Raman spectra on the cross section of porous silicon multilayers to sample different layer depths. We find noticeable differences in the spectra of layers with different porosity, as expected …

Determination of Stress in Porous Silicon by Micro-Raman Spectroscopy

We have studied the stress in porous silicon films as a function of depth and porosity using micro-Raman spectroscopy. Raman spectra were measured at different points along a cross section cleaved normal to the layer planes. Each spectrum was fitted …

Laser Heating in Porous Silicon Studied by Micro-Raman Spectroscopy

We have measured the temperature rise in nanoporous silicon under strong illumination. A green laser beam was focused with a microscope objective on porous silicon films with porosities between 55% and 80%. The Raman spectrum was measured for power …

A Galvanostatic Study of the Electrodeposition of Polypyrrole Into Porous Silicon

Polypyrrole has been electrodeposited in the interior of the pores that form the porous silicon structure, and a very significant increase of the electrical conductivity of the samples has been observed. Micro-Raman spectroscopy experiments have …

Depth-Resolved Microspectroscopy of Porous Silicon Multilayers

*Appl. Phys. Lett.* **75**, 977--979 (1999)

Deposition of polypyrrole into porous silicon

Depth-resolved micro-Raman study of porous silicon at different oxidation states

Photoluminescence ~PL! and Raman spectra were measured along a cross section of porous silicon films at different oxidation times after application of anodic current transients. The average crystallite size was determined from the Raman spectra with …