biaxial

Lattice-Mismatch Induced Stress in Porous Silicon Films
We have studied the stress in porous silicon films with different porosities at the interface with the substrate. Micro-Raman spectra …
Citar DOI
Determination of Stress in Porous Silicon by Micro-Raman Spectroscopy
We have studied the stress in porous silicon films as a function of depth and porosity using micro-Raman spectroscopy. Raman spectra …
Citar DOI