F. Agulló-Rueda
F. Agulló-Rueda
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semiconductors
Depth-Resolved Microspectroscopy of Porous Silicon Multilayers
We have measured micro-photoluminescence (PL) and micro-Raman spectra on the cross section of porous silicon multilayers to sample …
S. Manotas
,
F. Agulló-Rueda
,
J. D. Moreno
,
R. J. Martín-Palma
,
R. Guerrero-Lemus
,
J. M. Martínez-Duart
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DOI
Raman Spectroscopy of NiSe$_2$ and NiS$_{2-x}$Se$_x$ ($0 < x < 2$) Thin Films
The Raman spectra of NiS$_{2-x}$Se$_x$ ($0 < x < 2$) polycrystalline thin films have been measured for the first time in the …
C. de las Heras
,
F. Agulló-Rueda
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DOI
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