interface

Characterization of the interface between highly conductive Ga:ZnO films and the silicon substrate
Gallium-doped zinc oxide films are an interesting alternative for transparent conductive materials. To improve their performance, the …
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Characterization of the interface between highly conductive Ga:ZnO films and the silicon substrate
Highly conductive Ga-doped ZnO thin films deposited onto Si wafers: Interface characterization
Undoped ZnO and Ga:ZnO films deposited onto Si wafer substrates have been prepared and characterized in order to investigate the …
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Espectroscopía Raman
Este capítulo es una introducción a la espectroscopía Raman. Con esta técnica óptica se estudian de forma no destructiva compuestos en …
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Espectroscopía Raman