lattice mismatch

Lattice-Mismatch Induced Stress in Porous Silicon Films
We have studied the stress in porous silicon films with different porosities at the interface with the substrate. Micro-Raman spectra …
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Determination of Stress in Porous Silicon by Micro-Raman Spectroscopy
We have studied the stress in porous silicon films as a function of depth and porosity using micro-Raman spectroscopy. Raman spectra …
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Depth-Resolved Microspectroscopy of Porous Silicon Multilayers
Appl. Phys. Lett. 75, 977–979 (1999)
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Depth-Resolved Microspectroscopy of Porous Silicon Multilayers