porous

Structural Characteristics of $p$-Type Porous Silicon and their Relation to the Nucleation and Growth of Pores

The influence of the anodization time on some structural characteristics (dissolved mass, maximum porous layer thickness, porosity, crystallite size, etc.) of p-type porous silicon has been investigated. It is shown that chemical dissolution of the …

Lattice-Mismatch Induced Stress in Porous Silicon Films

We have studied the stress in porous silicon films with different porosities at the interface with the substrate. Micro-Raman spectra were measured along a cleaved cross section to sample different layer depths. Each spectrum was fit to the phonon …

Depth-Resolved Microspectroscopy of Porous Silicon Multilayers

We have measured micro-photoluminescence (PL) and micro-Raman spectra on the cross section of porous silicon multilayers to sample different layer depths. We find noticeable differences in the spectra of layers with different porosity, as expected …

Determination of Stress in Porous Silicon by Micro-Raman Spectroscopy

We have studied the stress in porous silicon films as a function of depth and porosity using micro-Raman spectroscopy. Raman spectra were measured at different points along a cross section cleaved normal to the layer planes. Each spectrum was fitted …

Laser Heating in Porous Silicon Studied by Micro-Raman Spectroscopy

We have measured the temperature rise in nanoporous silicon under strong illumination. A green laser beam was focused with a microscope objective on porous silicon films with porosities between 55% and 80%. The Raman spectrum was measured for power …

A Galvanostatic Study of the Electrodeposition of Polypyrrole Into Porous Silicon

Polypyrrole has been electrodeposited in the interior of the pores that form the porous silicon structure, and a very significant increase of the electrical conductivity of the samples has been observed. Micro-Raman spectroscopy experiments have …

Depth-Resolved Microspectroscopy of Porous Silicon Multilayers

*Appl. Phys. Lett.* **75**, 977--979 (1999)

Deposition of polypyrrole into porous silicon

Depth-resolved micro-Raman study of porous silicon at different oxidation states

Photoluminescence ~PL! and Raman spectra were measured along a cross section of porous silicon films at different oxidation times after application of anodic current transients. The average crystallite size was determined from the Raman spectra with …