spectroscopy

Raman Spectroscopy of Wurtzite InN Films Grown on Si
Solid State Comm. 115, 19–21 (2000)
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Raman Spectroscopy of Wurtzite InN Films Grown on Si
Depth-Resolved Microspectroscopy of Porous Silicon Multilayers
Appl. Phys. Lett. 75, 977–979 (1999)
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Depth-Resolved Microspectroscopy of Porous Silicon Multilayers
Depth-resolved micro-Raman study of porous silicon at different oxidation states
Photoluminescence ~PL! and Raman spectra were measured along a cross section of porous silicon films at different oxidation times after …
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Dielectric characterization of oxyacetylene flame-deposited diamond thin films
The dielectric properties of CVD diamond films grown by the oxyacetylene flame method for frequency dependent electrical fields have …
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Raman Active Phonons of $R$Fe$_3$(BO$_3$)$_4$ $R$=La or Nd Single Crystals
Oriented single crystals of $R$Fe$_3$(BO$_3$)$_4$, with $R$=La or Nd, have been studied by Raman spectroscopy. Spectra with the …
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Structure of High Index Proton Exchange LiNbO$_3$ Waveguides with Undegraded Nonlinear Optical Coefficients
A structural study is presented on proton exchanged LiNbO$_3$ waveguides prepared in benzoic acid vapor which, for $z$-cut substrates, …
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Laser-Assisted Recrystallization to Improve the Surface Morphology of CdTe Epitaxial Layers
Laser-assisted recrystallization has been studied in order to improve the surface morphology of CdTe layers grown on sapphire …
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Effect of Thermal Annealing on Te Precipitates in CdTe Wafers Studied by Raman Scattering and Cathodoluminescence
A combination of Raman scattering and cathodoluminescence techniques has been used to study the spatial distribution of Te precipitates …
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Elimination of Te Precipitates from CdTe Wafers
Undoped and doped CdTe wafers have been thermally annealed in Ga melt, or in Cd vapour or in a vacuum to eliminate Te precipitates from …
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Doubly Resonant Raman Scattering Induced by an Electric Field
Phys. Rev. B 38, 12720–12723 (1988)
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Doubly Resonant Raman Scattering Induced by an Electric Field